TLV3802QDSSRQ1

Texas Instruments
595-TLV3802QDSSRQ1
TLV3802QDSSRQ1

Mfr.:

Description:
Analog Comparators DUAL CHANN 225PS TPD LVDS OUTPUT COMP

Datasheet:
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In Stock: 2,911

Stock:
2,911 Can Dispatch Immediately
Factory Lead Time:
12 Weeks Estimated factory production time for quantities greater than shown.
Minimum: 1   Multiples: 1
Unit Price:
£-.--
Ext. Price:
£-.--
Est. Tariff:
Packaging:
Full Reel (Order in multiples of 3000)

Pricing (GBP)

Qty. Unit Price
Ext. Price
Cut Tape / MouseReel™ †
£8.84 £8.84
£6.94 £69.40
£6.47 £161.75
£5.94 £594.00
£5.70 £1,425.00
£5.55 £2,775.00
£5.42 £5,420.00
Full Reel (Order in multiples of 3000)
£5.26 £15,780.00
† A MouseReel™ fee of £3.50 will be added and calculated in your basket. All MouseReel™ orders are non-cancellable and non-returnable. ↩

Product Attribute Attribute Value Select Attribute
Texas Instruments
Product Category: Analog Comparators
RoHS:  
SMD/SMT
WSON-12
2 Channel
LVDS
Differential
2.4 V
5.25 V
19 mA
500 uV
2 uA
- 40 C
+ 125 C
TLV3802
Reel
Cut Tape
MouseReel
Brand: Texas Instruments
CMRR - Common Mode Rejection Ratio: 80 dB
Country of Assembly: Not Available
Country of Diffusion: Not Available
Country of Origin: TH
Ios - Input Offset Current: 4 uA
Moisture Sensitive: Yes
Product: Analog Comparators
Product Type: Analog Comparators
Propagation Delay Time: 225 ps
PSRR - Power Supply Rejection Ratio: 80 dB
Shutdown: No Shutdown
Factory Pack Quantity: 3000
Subcategory: Amplifier ICs
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Attributes selected: 0

Datasheet

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CNHTS:
8542399000
CAHTS:
8542330000
USHTS:
8542330001
MXHTS:
8542330299
ECCN:
EAR99

TLV380x/TLV380x-Q1/TLV3811 High-Speed Comparators

Texas Instruments TLV380x/TLV380x-Q1/TLV3811 High-Speed Comparators have a wide power supply range and a very high toggle frequency of 3GHz. With an operating supply voltage range of 2.7V to 4.2V for single supply and 2.7V to 5.25V for split supply, these features come in industry-standard small packages. These features make these devices an excellent choice for LIDAR, differential line receiver applications, and test and measurement systems.

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